This two-day summit will reveal and discuss many of the critical variables that can negatively impact product development, production, and testing. The “hands-on” demonstrations will provide an insightful look at some of the factors hidden in a "measurement loop" that produce headaches, heartbreaks, and cost overruns. (PRWeb May 05, 2014) Read the full story at http://ift.tt/12Pugl3 ...
News Source
News Source
No comments:
Post a Comment